Multimeter with Cable Checker Phone Test Lan Wire Test

VA43 - Shanghai Yi Hua V&A Instrument Co., Ltd. CO.,LTD

Lan Telephone test multimeter: VA43 is a multimeter with lan wire test. phone test .cable check.

High Voltage, Continuity & Hipot, Cable & Wire Harness Test Systems

CableEye HVX, HVX-21 - CAMI Research Inc. (CableEye®)

Fast ● Simple ● Precise Advanced wiring analyzer scans for continuity (opens, shorts), miswires, resistance, capacitance, components (resistors, diodes, LEDs, capacitors) dielectric breakdown, insulation resistance, intermittent connections HVX (Item 829) 1500 Vdc, 1000 Vac HVX-21 (Item 829A) 2100 Vdc, 1200 Vac For diagnostic and Pass/Fail Testing — Permits expanded testing (compared to models in our low voltage product line) for insulation resistance (IRI) and dielectric breakdown (DWV). All CableEye testers are suitable for production, fault diagnosis, QC (Quality Control), assembly, and prototyping of standard or custom cables. Each combines test, fault location, design, documentation, labeling, and database storage in one instrument. Tests can be performed on long cables (with or without connectors) or no cables (e.g. connectors, backplanes, PCBs, components). Standard Features & Benefits:

• USB certified, PC-based tester for a versatile, fast, robust system with long life-cycle.
• Multilingual, dynamic, graphic-rich display (netlist & wiring schematic) provides clarity and speeds diagnostics.
• 128 Test Points, expandable to 1024 providing flexibility as your product line changes.
• User-selectable voltage to each connection group in the cable simplifies an otherwise complex process, accelerating testing.
• Programmable Ramp Up, Ramp Down, Dwell Time (same as Test Time), Trip Current, and Trip Delay (same as Soak Time) adds versatility.
• Current leakage detected during HV test phase provides a measure of insulation resistance up to 1 GΩ (HVX) and 5 GΩ (HVX-21) - any leakage current exceeding a preset limit reveals the presence of moisture, flux, or other contamination on exposed contacts.
• Real-time screening for intermittent connections for pinpointing elusive faults and improving quality.
• Automation scripting in a simple, intuitive language allowing non-programmers to reduce operator error by automating repetitive steps.
• Pop-Up Work Instructions. choose the exact amount of detail, imagery, language and automation you need to ensure your work instructions and tests are carried out flawlessly.
• Flexible tolerancing: optionally define as percentages or absolute terms, as well as asymmetrically (e.g. +0%/-10%) for improved yields.
• Barcode-tracking & archival data-logging to achieve error-proof test process and improved traceability & productivity.
• Print PASS/FAIL labels, test reports (with or without color wiring schematics/netlists) and log reports to satisfy ISO9000 reporting requirements.
• Compatible with laptop and touchscreen PCs for fieldwork and rack/off-bench mounting.

Includes: CB29 board set (Item 759) for bare wire connections; comprehensive PC software with Database of >200 standard cables; 2 yr Product Support Subscription comprising Warranty, free tech support, and free software upgrades. Select Add-On Options: Hardware: 128-point Expansion Modules (attach to base); 4-Wire Kelvin Resistance Measurement, 1 mΩ at 1 A; Advanced Measurements; External Measurement Instrument Port (e.g. 10 GΩ Isolation at 100 V); Remote Control Connector for Deadman Switch; Environmental Sensor Software: PinMap™ fixture editor, Connector Designer™ connector editor, or Autobuild™ guided assembly modules camiresearch.com |@CAMI_CableEye |+1.978.266.2655

Tactical Radio Test Set

CTS-6010 - Astronics Corporation

The CTS-6010 brings an entire test bench to your front lines. Enable your technicians to detect equipment faults and verify operational capabilities at the I- and O-levels, saving valuable diagnostic time and cost.

Test Solutions

Astronics Corporation

Our range of test solutions is far reaching, comprised of off-the-shelf test instruments and interfaces, standard automated test systems, and custom solutions for test, simulation, and training. Put our E2E focus and experience to work for you with these solutions: automated test equipment, maintenance trainers, and test management software.

Test Management Software

Astronics Corporation

Develop and deploy device tests with a host of software solutions.

EFT Module for Teststand

Bloomy Controls, Inc.

The Electronics Functional Test (EFT) Module for TestStand provides out-of-the-box tools to speed up development of automated tests for electronic assemblies including PCBAs, subassemblies and final assemblies. Test engineers can develop, deploy and execute test sequences quickly and efficiently with minimal custom code development for a shorter time-to-solution.

PCIe 5.0 Test Platform

PXP-500A - Teledyne LeCroy

The Teledyne LeCroy PXP-500A Test Platform provides a convenient means for testing PCIe 5.0 cards with a self-contained portable and powered passive backplane. The PXP-500A provides power required for both cards under test.

PCI Express 5.0 Test Platform

Teledyne LeCroy

Teledyne LeCroy’s PCI Express 5.0 Test Platform is part of a suite of tools that facilitates complete protocol testing of PCI Express devices up to and including version 5.0. The latest feature of the Teledyne LeCroy Test Platform is the addition of an integrated interposer, which eliminates the need for an external interposer. This innovation simplifies setup with fewer connection points and outboard devices, making analysis easier and more reliable than ever. In addition to using the Test Platform with the Exerciser, the user can connect two of their own devices and use the Test Platform as a PCIe 5.0 backplane and as an interposer to capture protocol traffic between the systems.

ARINC 818 Tester

iWave Systems Technologies

iWave 3U VPX High-Speed Video/Data Processing Card is a rugged standalone module in the 3U VPX form factor, aimed for the high-speed data, video processing, and display applications is ideal for military, defense, and aerospace applications requiring an optimal balance of performance and power efficiency. iWave 3U VPX High-Speed Video/Data Processing Card is implemented using Xilinx Kintex-7 device architecture and has I/O interfaces including High speed 16 channels of transceiver interfaces capable of operating up to 6 Gbps data rate, Gigabit Ethernet, RS232, RS422, PCIe interface, Built-in health monitoring circuits, HDMI input, and output interfaces

FPD Tester Model

27014 - Chroma ATE Inc.

Chroma 27014 Flat Panel Display Tester is a complete testing solution that meets the Liquid Crystal Module testing requirements of production line. With integrated video generator, multi-channel precision power supply and process control unit, the system allows a complete test of signal, pattern and electrical parameters of LCM through a PC or remote control box.

Semiconductor Test System

TS-960e - Marvin Test Solutions, Inc.

The GENASYS Semi TS-960e PXI Express Semiconductor Test System is an integrated test platform that offers comparable system features and capabilities found in proprietary ATE systems. Available as a bench top system or with an integrated manipulator, the TS-960e takes full advantage of the PXI architecture to achieve a cost-effective and full-featured test solution for device, SoC and SiP test applications.

PXI Semiconductor/IC Test System

Chroma ATE Inc.

A high-density 100MHz PXIe digital IO card designed for characterizing, validating, and testing a variety of digital and mixed-signal ICs. Each IO card consists of a Sequencer Pattern Generator (SQPG) and 32 channels of full ATE-like features. The 33010 IO card is expandable up to 256 channels. Some unique features of the 33010 include an on-board SQPG, per pin timing/levels/ PMU/TFMU, multiple time domains, and multithreaded testing for complex IC testing. Each channel is also equipped with 64M vector memory, 16 timing sets with on-the-fly timing change, and per pin timing and frequency measurements up to 400 MHz.

Advanced SoC Test System

3680 - Chroma ATE Inc.

The Chroma 3680 is an advanced SoC test system with data rate up to 1Gbps. The Chroma 3680 is capable of conducting parallel tests on multiple chips to meet the digital and analog IC testing requirements, with applications including MCU, digital audio, digital TV, set-top box, DSP, network processor, field programmable gate array (FPGA) and consumer electronics.

Advanced SoC/Analog Test System

3650-EX - Chroma ATE Inc.

Chroma 3650-EX is specifically designed for high-throughput and high parallel test capabilities to provide the most cost effective solution for fabless, IDM and testing houses.

Photodiode Burn-in Reliability Test System

58606 - Chroma ATE Inc.

The Chroma 58606 PD/APD Burn-in system is a high density, multifunction and temperature controlled module based system for photo diode burn-in and lifetime test. Each module has up to 256 Source Measurement Unit channels which can source current and measure voltage in various scenarios such as one described below. The system can accommodate 7 modules for a total of 1,792 device channels.